Yield Engineer, RF Final Test Integration (Starlink/Akoustis)

<div class="content-intro"><p>SpaceX was founded under the belief that a future where humanity is out exploring the stars is fundamentally more exciting than one where we are not. Today SpaceX is actively developing the technologies to make this possible, with the ultimate goal of enabling human life on Mars.</p></div><p><strong>YIELD ENGINEER, RF FINAL TEST INTEGRATION (STARLINK/AKOUSTIS)</strong></p> <p>Akoustis is now operating as a wholly owned subsidiary of SpaceX, providing industry leading RF filters using patented XBAW technology to help drive the mission of making human life multi-planetary and connecting the world through Starlink. We design, build, launch, and operate the world's largest constellation of satellites, enabling us to operate a global internet network unbounded by traditional ground infrastructure limitations. The root of SpaceX’s success so far lies in our mission to keep all engineering and production in-house, which enables a tight feedback loop, nimble decision-making, and speedy deliverables. With millions of daily users worldwide already online, Starlink is truly a game-changer and levels the playing field for those who were previously unconnected.</p> <p>We are seeking a driven and detail-oriented Yield Engineer to join our RF device manufacturing team. This role focuses on correlating RF final test results with front-end wafer-level performance to identify and eliminate root causes of yield loss. You will be responsible for developing and implementing RF test solutions, managing test workflows, and driving process improvements across wafer probe and final test operations. The ideal candidate brings experience in RF test development, yield analysis, and statistical process control, with a passion for solving complex yield issues in a fast-paced, high-mix production</p> <p><strong>RESPONSIBILITIES:</strong></p> <ul> <li>Develop and implement RF test cases and calibration procedures for BAW filter devices operating in the 2 GHz to >10 GHz range</li> <li>Establish strong linkages between wafer probe data and final RF test performance, driving root cause analysis of yield detractors</li> <li>Use statistical tools such as SPC and DOE to monitor, control, and improve yield across the manufacturing flow</li> <li>Develop and maintain Cost of Ownership (CoO) and risk models to evaluate probe test strategies and ensure effective test coverage</li> <li>Sustain and optimize workflow and throughput in a high-mix RF test work center, driving continuous improvements in cycle time and cost</li> <li>Collaborate with design teams to provide feedback on DFM (Design for Manufacturability) and yield optimization opportunities</li> <li>Lead and mentor test operators, ensuring proper execution of test plans and maintenance of clean, organized workflows</li> <li>Support installation and qualification of new test tools, including both capability enhancements and capacity expansions</li> <li>Work closely with operation team and tool vendors to resolve equipment and process-related issues</li> <li>Create and maintain Standard Operating Procedures (SOPs), engineering instructions, and test documentation</li> </ul> <p><strong>BASIC QUALIFICATIONS:</strong></p> <ul> <li>Bachelor’s degree in electrical engineering, physics, materials science, or other STEM discipline</li> <li>Experience in RF testing, yield engineering, or semiconductor manufacturing (internship or professional)</li> </ul> <p><strong>PREFERRED QUALIFICATIONS:</strong></p> <ul> <li>2+ years of experience in RF test development or semiconductor yield engineering.</li> <li>Working knowledge of RF measurement principles, including S-parameters, insertion loss, return loss, and calibration.</li> <li>Familiarity with RF BAW filter technology and associated test challenges.</li> <li>Experience using automated probe stations, VNAs, and RF measurement tools.</li> <li>Strong analytical skills with demonstrated ability to perform data analysis, root cause analysis, and y ... (truncated, view full listing at source)