Senior DFT Engineer

K2 Space
United States - Remote$170k – $250kPosted 31 March 2026

Job Description

K2 is building the largest and highest-power satellites ever flown, unlocking performance levels previously out of reach across every orbit. Backed by $450M from leading investors including Altimeter Capital, Redpoint Ventures, T. Rowe Price, Lightspeed Venture Partners, Alpine Space Ventures, and others – with an additional $500M in signed contracts across commercial and US government customers – we’re mass-producing the highest-power satellite platforms ever built for missions from LEO to deep space. The rise of heavy-lift launch vehicles is shifting the industry from an era of mass constraint to one of mass abundance, and we believe this new era demands a fundamentally different class of spacecraft. Engineered to survive the harshest radiation environments and to fully capitalize on today’s and tomorrow’s massive rockets, K2 satellites deliver unmatched capability at constellation scale and across multiple orbits. With multiple launches planned through 2026 and 2027, we're Building Bigger to develop the solar system and become a Kardashev Type II (K2) civilization. If you are a motivated individual who thrives in a fast-paced environment and you're excited about contributing to the success of a groundbreaking Series C space startup, we’d love for you to apply. The Role We are seeking a highly experienced Senior Design-for-Test (DFT) Engineer to lead and drive DFT architecture and implementation for complex mixed-signal SOCs. This role requires deep expertise in memory BIST and TAP controller insertion at RTL, scan insertion and ATPG, and test strategy development across digital and mixed-signal domains. You will play a critical role in ensuring high test coverage, manufacturability, and first-pass silicon success while collaborating closely with design, verification, and physical design teams. Responsibilities Define and implement DFT architecture for mixed-signal SoCs, including scan, MBIST, LBIST, and boundary scan. Lead RTL-level DFT insertion, scan chain insertion and optimization, test point insertion, and low-power DFT methodologies. Own ATPG flow development and execution by generating high-quality stuck-at, transition, and path delay test patterns. Drive coverage closure and pattern optimization and debug pattern failure and silicon correlation. Develop and integrate DFT strategies for mixed-signal blocks, including wrapper-based approaches, and analog test interfaces and BIST solutions. Collaborate with RTL, DV, and PD teams to ensure clean DFT integration at RTL and gate-level, and timing and physical constraints alignment (scan reordering, compression, etc.). Drive DFT verification and signoff, including Scan/ATPG coverage metrics, DRC/Lint checks (DFT rule compliance), gate-level simulation and pattern validation. Support bring-up and silicon debug activities by analyzing tester failures, yield issues, and ATPG pattern correlation with silicon behavior. Contribute to methodology development, automation, and flow improvements. Qualifications B.S. or M.S. in Electrical Engineering or related field. 7+ years of experience in DFT for complex SoCs. Strong hands-on experience with RTL DFT insertion (scan, compression, test points), and ATPG tools and flows. Deep understanding of scan architectures, compression techniques, fault models (stuck-at, transition, bridging, path delay), coverage analysis and closure strategies. Experience with low-power DFT techniques. Familiarity with mixed-signal integration challenges and test methodologies. Strong debugging skills across RTL, gate-level, and silicon. Nice to Have Experience with MBIST/LBIST implementation and memory repair flows. Knowledge of IEEE 1149.x (JTAG/boundary scan) standards. Experience with multi-voltage domain and power-aware DFT. Exposure to physical design impacts on DFT (scan chain reordering, congestion, timing). Scripting experience for automation. Experience in high-speed interfaces (SerDes) or RF/mixed-signal SoCs. ... (truncated, view full listing at source)
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